Zanette, I., Zdora, M.C., Zhou, T., Bruvall, A., Larsson, D.H., Thibault, P. Hertz, H.M. & Pfeiffer, F. X-ray microtomography using correlation of near-field speckles for material characterization. Proc Natl Acad Sci USA 112, 12569–12573 (2015) [https://doi.org/10.1073/pnas.1502828112]
Purpose: We present X-ray speckle tracking tomography, a simple, robust, and versatile method to obtain simultaneously phase and absorption tomograms of the sample at the micrometer scale with a laboratory X-ray source.
Figure: Characterization of the near-field X-ray speckle pattern. (A) Projection image of the sample superimposed on the speckle pattern as recorded during the tomographic scan. Enlarged views of the speckles in the region-of-interest (200 × 100 pixels) indicated with a white box in A are shown (B) without and (C) with sample, respectively. (D) Comparison of the profile plots taken at the dashed lines in B and C. (E) Visibility map over the full field of view. The normalized autocorrelation function used to evaluate the speckle size is shown in (F) surface plot and in (G) orthogonal sections through the center of F.