Measurement and Sensor Technology

Dozierende/Lecturers

Prof. Dr. P. Müller-Buschbaum
Prof. Dr. Christian Große

Details:

Wednesdays, 10:00 to 12:00 am
Location: Physics-II Building, Seminar Room 227
Lecturer: Prof. Dr. Peter Müller-Buschbaum/Prof. Dr. Christian Grosse

Exercises:

Wednesdays, 9:00 - 10:00 am

Location: Physics-II Building, Seminar Room 227

Consulting Hour:

From April 10 to June 5, 2024

Wednesdays, 6:30 pm - 8 pm
Location:  office of Prof. Dr. Peter Müller-Buschbaum
Physics Building, 1st floor, room 3278

Description:

This module gives an introduction to measurement and sensor technologies starting from fundamental concepts. Modern state-of-the-art measurement methods will be discussed and illustrated with selected examples. It covers the following chapters:

Section 1: 

• Introduction, measurements, coordinate systems
• Optical microscopy, electron microscopy, atomic force microscopy
• X-ray and neutron scattering, diffraction and small angle scattering
• X-ray based thin film analysis
• Infrared- and UVvis spectroscopy

Section 2:

• Active and passive sensing (inspection and monitoring)
• Systems, signals and time series; sensor concepts and calibration
• Effect of defect concept (explained for CFRC parts for lightweight structures)
• Classification of measuring results; Probability of Detection (PoD) for NDT applications
• Overview of non-destructive testing techniques
• NDT applications in automotive and aeronautic
  • Optical lock-in thermography at CFRC
  • Phased-array and total focusing methods using ultrasound
  • Wireless sensing techniques and sensor networks in structural health monitoring

Objectives:

Upon successful participation in the module, students will be able to:

1. know about general principles with regard to methodology and measurements in physics,
2. calculate experimental errors,
3. handle the concepts of microscopy and imaging techniques,
4. calculate diffraction spectra,
5. apply the principles of x-ray and neuron scattering,
6. handle small angle scattering analysis,
7. apply the fundamentals of x-ray based thin film analysis,
8. know selected examples from thin film analysis,
9. apply the fundamentals of infrared and UVvis spectroscopy, 
10. know selected examples from optical spectroscopy analysis,
11. analyzing the measuring chain to know the influence of individual parts including sensor characteristics
12. know concepts to select proper testing techniques based on Effect-of-Defect methods
13. know classification concepts for NDT results including the Probability-of-Detection
14. know the principles of NDT applications to investigate large structures
15. apply active infrared thermography methods to investigate carbon fiber reinforced structures
16. apply active ultrasound NDT techniques including phased-array
17. apply passive sensing techniques like wireless sensors for structural health monitoring

Examinations

Oral examinations (30 min) will be held at the end of July (precise date/time to be communicated to each participant via e-mail)

Registration: in TUM-Online.