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New publication about near-field ptychography

Lensless x-ray microscopy has many applications in different fields of research but can be challenging whith strongly absorbing and refracting samples. Marco Stockmar and co-workers demonstrated that near-field ptychography can efficiently address this challenge and published their results in the lastest issue of Physical Review Applied.

PAPER ABSTRACT

Inline holography, like other lensless imaging methods, circumvents limitations of x-ray optics through an a posteriori phase-retrieval step. However, phase retrieval for optically thick, i.e., strongly absorbing and phase shifting, specimens remains challenging. In this paper, we demonstrate that near-field ptychography can be used to efficiently perform phase retrieval on a uranium sphere with a diameter of about 46  μm, which acts as an optically thick sample. This particular sample was not accessible by inline holography previously. The reconstruction is based on a statistical model and incorporates partial coherence by decomposing the illumination into coherent modes. Furthermore, we observe that phase vortices, which can occur as artifacts during the reconstruction, pose a greater challenge than in far-field methods. We expect that the methods described in this paper will allow production of reliable phase maps of samples which cannot be accessed by inline holography.

DOI: http://dx.doi.org/10.1103/PhysRevApplied.3.014005